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Please use this identifier to cite or link to this item: http://dspace.vnbrims.org:13000/xmlui/handle/123456789/4842
Title: Operational risk management : a practical approach to intelligent data analysis
Authors: Kenett, Ron S.
Raanan, Yossi
Keywords: Risk management.
Quality control.
Information technology–Quality control
Issue Date: 20-Apr-2021
Publisher: John Wiley & Sons, Inc
URI: http://dspace.vnbrims.org:13000/xmlui/handle/123456789/4842
ISSN: 978-0-470-74748-3
Appears in Collections:Operations

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