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Please use this identifier to cite or link to this item: http://dspace.vnbrims.org:13000/xmlui/handle/123456789/4842
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dc.contributor.authorKenett, Ron S.-
dc.contributor.authorRaanan, Yossi-
dc.date.accessioned2021-04-20T11:56:08Z-
dc.date.available2021-04-20T11:56:08Z-
dc.date.issued2021-04-20-
dc.identifier.issn978-0-470-74748-3-
dc.identifier.urihttp://dspace.vnbrims.org:13000/xmlui/handle/123456789/4842-
dc.language.isoenen_US
dc.publisherJohn Wiley & Sons, Incen_US
dc.subjectRisk management.en_US
dc.subjectQuality control.en_US
dc.subjectInformation technology–Quality controlen_US
dc.titleOperational risk management : a practical approach to intelligent data analysisen_US
dc.typeBooken_US
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